Conference
Multifrequency TAM Design for Hierarchical SOCs
Abstract
The emergence of megacores in hierarchical system-on-a-chip (SOC) presents new challenges to electronic test automation. This paper describes a new framework for designing test access mechanisms (TAMs) for modular testing of hierarchical SOCs. We first explore the concept that TAMs on the same level of design hierarchy employ multiple frequencies for test data transportation. Then we extend this concept to hierarchical SOCs and, by introducing …
Authors
Xu Q; Nicolici N
Volume
25
Pagination
pp. 181-196
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2006
DOI
10.1109/tcad.2005.852440
Conference proceedings
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Issue
1
ISSN
0278-0070