published in IEEE International Conference on Computer Design - VLSI in Computers and Processors Journal
presented at event IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. Conference
keywords Computer Science Computer Science, Hardware & Architecture ENVIRONMENT Engineering Engineering, Electrical & Electronic FAULT-DIAGNOSIS SCAN-BASED BIST Science & Technology Technology built-in diagnosis test data compression
