Conference
A novel automated scan chain division method for shift and capture power reduction in broadside at-speed test
Authors
Ko HF; Nicolici N
Pagination
pp. 649-654
Publisher
IEEE COMPUTER SOC
Publication Date
January 1, 2008
ISBN-13
978-0-7695-3117-5
DOI
10.1109/ISQED.2008.64
Name of conference
9th International Symposium on Quality Electronic Design
Conference place
CA, San Jose
Conference start date
March 17, 2008
Conference end date
March 19, 2008
Conference proceedings
ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN