Conference
Sensitivity of Positron Annihilation Spectroscopy to Energy Contamination in Low Energy Boron Ion Implantation
Authors
Knights AP; Coleman PG
Volume
445-446
Pagination
pp. 123-125
Publisher
Trans Tech Publications
Publication Date
February 19, 2004
DOI
10.4028/www.scientific.net/msf.445-446.123
Conference proceedings
Materials Science Forum
ISSN
0255-5476