authors Crowe, Iain F Hulko, Oksana Knights, Andrew Hylton, Nicholas P Halsall, Matthew P Ruffell, Simon Gwilliam, Russell M
keywords EMISSION Engineering Engineering, Electrical & Electronic FILMS Ion implantation Optics Physical Sciences RAMAN-SCATTERING Raman Rapid thermal annealing SILICON NANOCRYSTALS SPECTRA Science & Technology Silicon nanocrystals Technology X-TEM