KLT analysis of brain potential maps during pain Conferences

authors

• Brauer, F
• Dick, BD
• Stroink, G
• Connolly, John
• McGrath, PJ
• Finley, GA

status

• accepted 

publication date

• January 1, 2000

published in

• Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings  Journal

presented at event

• 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society  Conference

keywords

• Engineering
• Engineering, Biomedical
• Engineering, Electrical & Electronic
• Karhunen-Loeve Transforms
• Science & Technology
• Technology
• eigenfunctions
• event related potentials
• mapping
• pain measurement

Digital Object Identifier (DOI)

• 10.1109/iembs.2000.901431

International Standard Book Number (ISBN) 10

• 0-7803-6466-X

start page

• 2755

end page

• 2756

volume

• 4