Conference
Sensitivity-Based Quantitative Imaging Using Planar Raster Scanning
Abstract
A quantitative imaging method based on the self-adjoint sensitivity analysis of S-parameters is proposed. The estimation of the medium complex dielectric permittivity is achieved in real time. The method requires the measurement of two objects as part of the system calibration: a reference and a calibration object. The method is validated with simulation examples based on a planar raster-scanning acquisition.
Authors
Tu S; Zhang Y; Nikolova NK
Pagination
pp. 671-672
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
July 1, 2014
DOI
10.1109/aps.2014.6904666
Name of conference
2014 IEEE Antennas and Propagation Society International Symposium (APSURSI)