Efficient TLM sensitivity analysis exploiting rubber cells Conferences

authors

• Basl, Peter AW
• Bakr, Mohamed
• Nikolova, Natalia Koleva

status

• published 

publication date

• June 2008

published in

• IEEE MTT-S International Microwave Symposium Digest  Journal

presented at event

• 2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008  Conference

keywords

• Computer Aided Design
• Engineering
• Engineering, Electrical & Electronic
• Physical Sciences
• Physics
• Physics, Applied
• Science & Technology
• Sensitivity Analysis
• Technology
• Transmission Line Modeling

Digital Object Identifier (DOI)

• 10.1109/mwsym.2008.4633101

International Standard Book Number (ISBN) 13

• 978-1-4244-1780-3

start page

• 53

end page

• 56