Conference
Central-node approach for accurate self-adjoint sensitivity analysis, of dielectric structures
Authors
Song Y; Nikolova NK
Series
IEEE MTT-S International Microwave Symposium
Pagination
pp. 894-897
Publisher
IEEE
Publication Date
January 1, 2007
ISBN-13
978-1-4244-0687-6
Name of conference
IEEE/MTT-S International Microwave Symposium
Conference place
Honolulu, HI
Conference start date
June 3, 2007
Conference end date
June 8, 2007
Conference proceedings
2007 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-6
ISSN
0149-645X