The impact of noise parameter de-embedding on the high-frequency noise modeling of MOSFETs Conferences

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authors

Chen, Chih-hung
Deen, Jamal
Chih-Hung Chen

status

accepted

publication date

January 1, 1999

published in

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) Journal

presented at event

International Conference on Microelectronic Test Structures Conference