A New Approach of High Frequency Noise Modeling for 70-nm NMOS Transistors by Accurate Noise Source Extraction Conferences

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authors

Kiyota, Y
Chen, Chih-hung
Kubodera, T
Nakamura, A
Takeshita, K
Deen, Jamal

status

published

publication date

June 2007

published in

IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers Journal

presented at event

2007 IEEE Radio Frequency Integrated Circuits Symposium Conference