Effects of hot-carrier stress on the RF performance of 0.18 μm technology NMOSFETs and circuits Conferences

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authors

Naseh, S
Deen, Jamal
Marinov, O

status

accepted

publication date

January 1, 2002

published in

2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) Journal

presented at event

2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual Conference