Conference
Effects of body biasing on the low-frequency noise of NMOSFETs from a 130-nm CMOS technology
Authors
Marin M; Deen MJ; de Murcia M; Llinares P; Vildeuil JC
Volume
5113
Pagination
pp. 56-65
Publisher
SPIE, the international society for optics and photonics
Publication Date
May 12, 2003
DOI
10.1117/12.488964
Name of conference
Noise in Devices and Circuits
Conference proceedings
Proceedings of SPIE--the International Society for Optical Engineering
ISSN
0277-786X