Noise in Advanced Electronic Devices and Circuits Conferences

authors

• Deen, Jamal

status

• published 

publication date

• 2005

published in

• AIP Conference Proceedings  Journal

presented at event

• NOISE AND FLUCTUATIONS: 18th International Conference on Noise and Fluctuations - ICNF 2005  Conference

keywords

• 1/F NOISE
• 1/f noise
• AMPLITUDE
• Engineering
• Engineering, Biomedical
• III-V
• IMPACT
• Instruments & Instrumentation
• LOW-FREQUENCY NOISE
• MODEL
• MOSFETS
• Optics
• PERFORMANCE
• Physical Sciences
• Physics
• Physics, Condensed Matter
• Physics, Mathematical
• RF integrated circuits
• RTS and phase noise
• SI
• Science & Technology
• TECHNOLOGY
• Technology
• VCO
• VCO with AAC
• degradation and reliability
• electrical stress
• flicker noise
• noise in devices

Digital Object Identifier (DOI)

• 10.1063/1.2036687

International Standard Book Number (ISBN) 10

• 0-7354-0267-1

start page

• 3

end page

• 12

volume

• 780

issue

• 1