Low frequency noise as a characterization tool for InP- and GaAs-based double-barrier resonant tunnelling diodes Conferences

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authors

Deen, Jamal

status

published

publication date

June 1993

has subject area

published in

Materials Science & Engineering B: Solid-State Materials for Advanced Technology Journal

presented at event

1ST WORKSHOP ON EXPERT EVALUATION AND CONTROL OF COMPOUND SEMICONDUCTOR MATERIALS AND TECHNOLOGIES : SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY ( EXMATEC 92 ) Conference