Flicker Noise due to Variable Range Hopping in Organic Thin-Film Transistors

In this paper, we introduce our work on the use of the variable range hopping to determine flicker noise in organic thin film transistors (OTFTs). We implemented the principal physical models for variable range hopping in a numerical simulator to determine the charge transport in OTFTs. These transport calculations yield a distribution of the charge hopping time which is used to calculate the flicker noise in OTFTs. The calculations are compared to experimental data and good agreement between experiments and simulation were obtained. This indicates that variable range hopping can be the origin of the l/f noise in OTFT in conjunction with the variable mobility in these devices.