Low-frequency noise in SiGeC-based pMOSFETs Conferences

authors

• Deen, Jamal
• Marinov, Ognian
• Onsongo, David
• Dey, Sagnik
• Banerjee, Sanjay

status

• published 

publication date

• May 25, 2004

published in

• Proceedings of SPIE - The International Society for Optical Engineering  Journal

presented at event

• Second International Symposium on Fluctuations and Noise  Conference

keywords

• 1/F NOISE
• Engineering
• Engineering, Electrical & Electronic
• IV semiconductor
• MOSFET
• Physical Sciences
• Physics
• Physics, Applied
• Physics, Condensed Matter
• Science & Technology
• Si-Ge-CFETs
• SiGe heterostructure FET
• SiGeC MOSFET
• Technology
• low frequency noise (LFN)
• noise analysis
• strained - compressed lattice in

Digital Object Identifier (DOI)

• 10.1117/12.548006

International Standard Book Number (ISBN) 10

• 0-8194-5396-X

start page

• 215

end page

• 225

volume

• 5470