Journal article
Theoretical and experimental characterization of self-heating in silicon integrated devices operating at low temperatures
Abstract
The self-heating of Si devices operating in the 4 K
Authors
De la Hidalga FJ; Deen MJ; Gutierrez EA
Journal
IEEE Transactions on Electron Devices, Vol. 47, No. 5, pp. 1098–1106
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
5 2000
DOI
10.1109/16.841246
ISSN
0018-9383