STATISTICAL SIMULATIONS OF THE LOW-FREQUENCY NOISE IN POLYSILICON EMITTER BIPOLAR TRANSISTORS USING A MODEL BASED ON GENERATION-RECOMBINATION CENTERS Academic Article uri icon

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authors

  • SANDÉN, MARTIN
  • ÖSTLING, MIKAEL
  • MARINOV, OGNIAN
  • Deen, Jamal

publication date

  • June 2001