RF noise models of MOSFETs - A review Conferences

authors

• Asgaran, S
• Deen, Jamal

status

• published 

publication date

• January 1, 2004

published in

• NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS  Journal

presented at event

• Nanotechnology Conference and Trade Show (Nanotech 2004)  Conference

keywords

• CHANNEL NOISE
• CMOS
• Engineering
• Engineering, Electrical & Electronic
• Engineering, Mechanical
• MOSFET
• Science & Technology
• THERMAL NOISE
• Technology
• compact modeling
• thermal noise

International Standard Book Number (ISBN) 10

• 0-9728422-8-4

start page

• 96

end page

• 101