Conference
Charge localization in polymeric metal-oxide-semiconductor capacitors
Abstract
Charge enhancement of organic materials that was deduced more than two decades ago by means of capacitance-voltage (C-V) measurements meets with difficulties and controversial explanations when using the classical semiconductor theory. Experimentally, it has been found that the charge localization results in nonstationary and frequency-dependent behavior in the C-V measurements. Detailed analyses of the experimental results provide insight on …
Authors
Marinov O; Deen MJ; Iniguez B; Ong B
Volume
24
Pagination
pp. 649-653
Publisher
American Vacuum Society
Publication Date
May 1, 2006
DOI
10.1116/1.2172929
Conference proceedings
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
Issue
3
ISSN
0734-2101