Determination of the atomic configuration at semiconductor interfaces Journal Articles

abstract

• We describe an approach based on high-resolution transmission electron microscopy (HRTEM), which is capable of directly and sensitively revealing the atomic configuration at compound semiconductor/semiconductor interfaces, and thus show that interfaces normally regarded as atomically smooth can contain significant roughness. Our technique establishes that HRTEM can simultaneously provide chemical and structural information on an atomic scale.

authors

• Ourmazd, A
• Tsang, WT
• Rentschler, JA
• Taylor, David

status

• published 

publication date

• May 18, 1987

has subject area

• 02 Physical Sciences (FoR)
• 09 Engineering (FoR)
• 10 Technology (FoR)
• Applied Physics (Science Metrix)

published in

• Applied Physics Letters  Journal

keywords

• Physical Sciences
• Physics
• Physics, Applied
• Science & Technology

Digital Object Identifier (DOI)

• 10.1063/1.97840

start page

• 1417

end page

• 1419

volume

• 50

issue

• 20