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Microstructural Evolution of Radiation-Induced...
Conference

Microstructural Evolution of Radiation-Induced Defects in Semi-Insulating SiC During Isochronal Annealing

Authors

Puff W; Balogh AG; Mascher P

Volume

338-342

Pagination

pp. 965-968

Publisher

Trans Tech Publications

Publication Date

May 10, 2000

DOI

10.4028/www.scientific.net/msf.338-342.965

Conference proceedings

Materials Science Forum

ISSN

0255-5476

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