Conference
Point defect characterization of Zn- and Cd-based semiconductors using positron lifetime spectroscopy
Authors
Tessaro G; Mascher P
Editors
Triboulet R; Capper P; MullerVogt G
Series
EUROPEAN MATERIALS RESEARCH SOCIETY SYMPOSIA-PROCEEDINGS
Volume
78
Pagination
pp. 581-585
Publisher
ELSEVIER SCIENCE BV
Publication Date
January 1, 1999
ISBN-10
0-08-043605-6
Name of conference
Symposium on Growth, Characterisation and Applications of Bulk II-VIs, at the E-MRS Spring Conference
Conference place
STRASBOURG, FRANCE
Conference start date
June 16, 1998
Conference end date
June 18, 1998
Conference proceedings
GROWTH, CHARACTERISATION AND APPLICATIONS OF BULK II-VIS