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Quantum Efficiency Measurements of Down-Shifting...
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Quantum Efficiency Measurements of Down-Shifting Using Silicon Nanocrystals for Photovoltaic Applications

Abstract

Silicon nanocrystal (Si-NC) luminescent downshifting materials for photovoltaic (PV) applications were fabricated by ion implantation and plasma-enhanced chemical vapor deposition (PECVD). The absolute optical conversion efficiency of the Si-NC-emitted photoluminescence was measured using conventional methods, and an optical set-up involving an integrating sphere. Modeling shows that down-shifting the light incident on a single-junction silicon …

Authors

Sacks J; Savidge RM; Gabr A; Walker A; Beal R; Wheeldon J; Knights AP; Mascher P; Hinzer K; Kleiman RN

Pagination

pp. 000092-000096

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

June 1, 2012

DOI

10.1109/pvsc.2012.6317575

Name of conference

2012 38th IEEE Photovoltaic Specialists Conference

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