An investigation of point defects in silicon carbide Conferences

authors

• Puff, W
• Boumerzoug, M
• Brown, J
• Mascher, Peter
• Macdonald, D
• Simpson, PJ
• Balogh, AG
• Hahn, H
• Chang, W
• Rose, M

status

• published 

publication date

• July 1995

has subject area

• 0204 Condensed Matter Physics (FoR)
• 0205 Optical Physics (FoR)
• 0912 Materials Engineering (FoR)
• Applied Physics (Science Metrix)

published in

• Applied Physics A: Materials Science and Processing  Journal

presented at event

• 132nd WE-Heraeus-Seminar on Positron Studies of Semiconductor Defects  Conference

keywords

• INTERFACE
• Materials Science
• Materials Science, Multidisciplinary
• Physical Sciences
• Physics
• Physics, Applied
• Science & Technology
• Technology

Digital Object Identifier (DOI)

• 10.1007/bf01538211

start page

• 55

end page

• 58

volume

• 61

issue

• 1