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Observation of non‐radiative de‐excitation...
Conference

Observation of non‐radiative de‐excitation processes in silicon nanocrystals

Abstract

Abstract We describe the impact of non‐radiative de‐excitation mechanisms on the optical emission from silicon nanocrystals formed in SiO 2 . Auger excitation via free carriers deliberately introduced through phosphorus ion implantation, shows a monotonic increase with increasing phosphorus concentration which can be modelled adequately using a simple statistical approach. We also report a reduction in nanocrystal luminescence intensity with …

Authors

Knights AP; Milgram JN; Wojcik J; Mascher P; Crowe I; Sherliker B; Halsall MP; Gwilliam RM

Volume

206

Pagination

pp. 969-972

Publisher

Wiley

Publication Date

May 2009

DOI

10.1002/pssa.200881306

Conference proceedings

physica status solidi (a) – applications and materials science

Issue

5

ISSN

1862-6300