XANES and XEOL Investigation of Cerium and Terbium Co-Doped Silicon Oxide Films Conferences

abstract

• The luminescent and structural properties of cerium and terbium co-doped silicon oxide thin films were investigated through transmission electron microscopy, photoluminescence spectroscopy, and synchrotron-based X-ray absorption spectroscopy. While combined blue and green luminescence characteristic of Ce3+ and Tb3+ ions, respectively, was observed from different compositions of films, the emission intensity from samples in which Ce2Si2O7 nanocrystallites were formed after high temperature annealing was much stronger than in films where the Ce and Tb co-dopants were incorporated in an amorphous SiO2 host matrix. Films containing the cerium silicate phase also exhibited a very strong enhancement of Tb emission. X-ray absorption near edge structure and X-ray excited optical luminescence analysis at the Si L3,2-, Si K-, O K-, Ce N4-, and Ce M5,4-edges indicated this enhancement was likely the result of a direct energy transfer process between the cerium silicate and Tb levels.

authors

• Wilson, Patrick R
• Khatami, Zahra
• Dabkowski, Ryszard
• Dunn, Kayne
• Chelomentsev, Evgueni
• Wojcik, J
• Mascher, Peter

status

• published 

publication date

• April 27, 2012

published in

• ECS Transactions  Journal

presented at event

• 2nd International Symposium on Nanoscale Luminescent Materials as Part of the 221st Meeting of the Electrochemical-Society (ECS)  Conference

keywords

• Electrochemistry
• Materials Science
• Materials Science, Multidisciplinary
• Physical Sciences
• Science & Technology
• Technology

Digital Object Identifier (DOI)

• 10.1149/1.3700408

International Standard Book Number (ISBN) 13

• 978-1-56677-957-9

start page

• 43

end page

• 48

volume

• 45

issue

• 5