Region of nearly constant off current versus gate length characteristics for sub-0.1 mu m low power CMOS technology Conferences uri icon

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authors

  • Lau, WS
  • Yang, Peizhen
  • Ng, Eu-gene
  • Chian, ZW
  • Ho, V
  • Siah, SY
  • Chan, L

publication date

  • January 1, 2008