Conference
Local characterization of Y-Ba-Cu-O thin films
Abstract
A high-resolution spatially resolved study of electrical inhomogeneities in high-T/sub c/ thin films by Laser Scanning Microscopy has been carried out. A laser beam was focused onto a submicrometer spot on the surface of the thin film microbridge resulting in an increase in its local temperature. Bolometric or thermo-electric effects in the heated region result in a voltage change across the sample that has been measured as a function of the …
Authors
Shadrin PM; Korolev KA; Hughes RA; Nam JK; Preston JS
Volume
11
Pagination
pp. 3226-3229
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 2001
DOI
10.1109/77.919750
Conference proceedings
IEEE Transactions on Applied Superconductivity
Issue
1
ISSN
1051-8223