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Determination of the Density of States in...
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Determination of the Density of States in Semiconductors from Transient Photoconductivity

Abstract

This paper discusses the techniques we have developed to analyse the photo-response of amorphous semiconductors to transient optical excitation to determine the energy distribution of gap states (DOS). We highlight the difficulties arising from a direct ‘single point’ approach using the instantaneous transient photocurrent i(t) when there is significant structure in the DOS or in the presence of recombination. Frequency domain methods which …

Authors

Main C

Volume

467

Pagination

pp. 167-178

Publisher

Springer Nature

Publication Date

12 1997

DOI

10.1557/proc-467-167

Conference proceedings

MRS Online Proceedings Library

Issue

1

ISSN

0272-9172