Conference
Poor confinement of E-H recombination zone in blue OLEDs
Authors
Sadek T; Aziz H; Loutfy RO; Smith PM
Series
Canadian Conference on Electrical and Computer Engineering
Pagination
pp. 1064-+
Publisher
IEEE
Publication Date
January 1, 2008
ISBN-13
978-1-4244-1642-4
Name of conference
Canadian Conference on Electrical and Computer Engineering
Conference place
Niagara Falls, CANADA
Conference start date
May 4, 2008
Conference end date
May 7, 2008
Conference proceedings
2008 CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING, VOLS 1-4
ISSN
0840-7789