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Sub-25nm direct write (maskless) X-ray...
Journal article

Sub-25nm direct write (maskless) X-ray nanolithography

Abstract

Sub-25nm continuous, reproducible features of arbitrary geometry were created by X-ray lithography in direct write (maskless) geometry, analogous to conventional electron beam lithography. This was achieved through the use of a laser interferometer-controlled scanning transmission X-ray microscope (STXM) equipped with a zone doubled Fresnel zone plate lens, and a cold development procedure. These features are among the smallest created with photons in direct write geometry.

Authors

Leontowich AFG; Hitchcock AP; Watts B; Raabe J

Journal

Microelectronic Engineering, Vol. 108, , pp. 5–7

Publisher

Elsevier

Publication Date

April 22, 2013

DOI

10.1016/j.mee.2013.03.006

ISSN

0167-9317

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