Journal article
Soft X-ray spectromicroscopy development for materials science at the Advanced Light Source
Abstract
Several third generation synchrotron radiation facilities are now operational, and the high brightness of these photon sources offers new opportunities for X-ray microscopy. Well developed synchrotron radiation spectroscopy techniques are being applied in new instruments capable of imaging the surface of a material with a spatial resolution smaller than 1 μm.There are two aspects to this. One is to further the field of surface science by …
Authors
Warwick T; Ade H; Hitchcock AP; Padmore H; Rightor EG; Tonner BP
Journal
Journal of Electron Spectroscopy and Related Phenomena, Vol. 84, No. 1-3, pp. 85–98
Publisher
Elsevier
Publication Date
March 1997
DOI
10.1016/s0368-2048(97)00026-1
ISSN
0368-2048