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Energy spikes in Si and Ge due to heavy ion...
Journal article

Energy spikes in Si and Ge due to heavy ion bombardment

Abstract

The number of displaced atoms/ion, N*D , produced by heavy ion bombardment (10-250 keV) of Si and Ge at 35 K is reported. A semi-empirical formulation is given, based upon the separation of the damage into a “spike” component and a “collisional” component, which adequately predicts N*D , for all ions and energies investigated. The “spike” concept is also tested by investigation of damage enhancement effects occuring for diatomic bombardment …

Authors

Thompson DA; Walker RS

Journal

Radiation Effects and Defects in Solids, Vol. 36, No. 1-2, pp. 91–100

Publisher

Taylor & Francis

Publication Date

1 1978

DOI

10.1080/00337577808233175

ISSN

1042-0150