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Improved InAsP metamorphic layers grown on an InP...
Journal article

Improved InAsP metamorphic layers grown on an InP substrate using underlying InP grown at low temperatures

Abstract

The use of an InP epitaxial layer grown at low temperatures before the growth of a step-graded InAsP metamorphic buffer has been shown to provide a large improvement in the crystal quality of the final metamorphic layer. The improvement is evidenced by over an order of magnitude increase in photoluminescence intensity as well as a large reduction of the mosaic spread and the overall tilt of the relaxed layers.

Authors

Czaban JA; Thompson DA; Robinson BJ

Journal

Semiconductor Science and Technology, Vol. 22, No. 4,

Publisher

IOP Publishing

Publication Date

April 1, 2007

DOI

10.1088/0268-1242/22/4/020

ISSN

0268-1242

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