Journal article
Interferometer-controlled scanning transmission X-ray microscopes at the Advanced Light Source
Abstract
Two new soft X-ray scanning transmission microscopes located at the Advanced Light Source (ALS) have been designed, built and commissioned. Interferometer control implemented in both microscopes allows the precise measurement of the transverse position of the zone plate relative to the sample. Long-term positional stability and compensation for transverse displacement during translations of the zone plate have been achieved. The interferometer …
Authors
Kilcoyne ALD; Tyliszczak T; Steele WF; Fakra S; Hitchcock P; Franck K; Anderson E; Harteneck B; Rightor EG; Mitchell GE
Journal
Journal of Synchrotron Radiation, Vol. 10, No. 2, pp. 125–136
Publisher
International Union of Crystallography (IUCr)
Publication Date
March 1, 2003
DOI
10.1107/s0909049502017739
ISSN
0909-0495