Journal article
Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter
Abstract
In the last 20 years, synchrotron-based soft X-ray microscopy has emerged as a powerful technique for chemical microanalysis. By efficiently measuring near-edge X-ray absorption spectroscopy (NEXAFS) at high spatial resolution, it produces information analogous to that delivered by electron energy loss spectroscopy in a transmission electron microscope (TEM-EELS). NEXAFS microscopy has significant advantages for studies of soft matter, which is …
Authors
Hitchcock AP; Dynes JJ; Johansson G; Wang J; Botton G
Journal
Micron, Vol. 39, No. 6, pp. 741–748
Publisher
Elsevier
Publication Date
August 2008
DOI
10.1016/j.micron.2007.09.010
ISSN
0968-4328