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Detrapping of positrons and thermal stability of...
Journal article

Detrapping of positrons and thermal stability of phosphorus-vacancy pairs in silicon

Abstract

Positron-lifetime measurements have been performed on heavily P-doped (1020 P/cm3) Czochralski-grown Si between room temperature and 1200?deC. Phosphorus-vacancy pairs formed in the sample show the characteristic lifetime of positrons in monovacancies, but a considerably lower binding energy (0.93±0.15 eV) for the positron in the trap than in free vacancies (≥1.6 eV). For the first time direct evidence for detrapping of positrons out of …

Authors

Mascher P; Kerr D; Dannefaer S

Journal

Physical Review B, Vol. 35, No. 6, pp. 3043–3046

Publisher

American Physical Society (APS)

Publication Date

February 15, 1987

DOI

10.1103/physrevb.35.3043

ISSN

2469-9950