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Journal article

Numerical Simulation of Feature Profile Evolution Using FPS-3D

Abstract

A reliable and predictive feature profile evolution simulator could be a very important tool for the nanotechnology and semiconductor industry. It would allow significant saving of time and resources otherwise spent on design experiments to find proper chemistries and conditions in a multidimensional parameter space in search for advanced etching and deposition. A recently developed general feature profile simulator (FPS-3D) optimized for computational speed, reliability, and graphics capability is discussed, and a couple of images from simulations are presented.

Authors

Moroz P

Journal

IEEE Transactions on Plasma Science, Vol. 39, No. 11, pp. 2804–2805

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

November 1, 2011

DOI

10.1109/tps.2011.2160364

ISSN

0093-3813

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