Journal article
Nonparametric Tests for Comparing Reliabilities of Coherent Systems at Specific Mission Time
Abstract
Authors
Xu X; Zhu X; Balakrishnan N; Ng KT
Journal
IEEE Transactions on Reliability, Vol. PP, No. 99, pp. 1–15
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2026
DOI
10.1109/tr.2025.3645861
ISSN
0018-9529