Journal article
A Novel Portable Edge-Intelligent System for Cross-Individual Fault Diagnosis
Abstract
Authors
Luo J; He Y; Hu X; Liu Z; Shen W
Journal
IEEE Transactions on Instrumentation and Measurement, Vol. 75, , pp. 1–12
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2026
DOI
10.1109/tim.2026.3652750
ISSN
0018-9456