Preprint
A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and Prospects
Abstract
Authors
Cheng Y; Cao Y; Yao H; Luo W; Jiang C; Zhang H; Shen W
Publication date
July 15, 2025
DOI
10.48550/arxiv.2507.13378
Preprint server
arXiv