Journal article
A comprehensive survey for real-world industrial surface defect detection: Challenges, approaches, and prospects
Abstract
Authors
Cheng Y; Cao Y; Yao H; Luo W; Jiang C; Zhang H; Shen W
Journal
Journal of Manufacturing Systems, Vol. 84, , pp. 152–172
Publisher
Elsevier
Publication Date
February 1, 2026
DOI
10.1016/j.jmsy.2025.11.022
ISSN
0278-6125