Journal article
On the Fundamental Limits of Integrated Sensing and Communications Under Logarithmic Loss
Abstract
Authors
Chen J; Yu L; Li Y; Shi W; Ge Y; Tong W
Journal
IEEE Transactions on Communications, Vol. 74, , pp. 46–60
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2026
DOI
10.1109/tcomm.2025.3624157
ISSN
0090-6778