Journal article
Reliability estimation under cyclic accelerated life-testing based on scale family of distributions
Abstract
Authors
Zhang W; Zhu X; He M; Balakrishnan N
Journal
Computers & Industrial Engineering, Vol. 211, ,
Publisher
Elsevier
Publication Date
January 1, 2026
DOI
10.1016/j.cie.2025.111600
ISSN
0360-8352