Journal article
Testing Bayes Error Rate Estimators in Difficult Situations Using Monte Carlo Simulations
Abstract
Authors
Wheat L; Mohrenschildt MV; Habibi S
Journal
IEEE Access, Vol. 13, , pp. 165810–165829
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2025
DOI
10.1109/access.2025.3609630
ISSN
2169-3536