Journal article
Physics-informed machine learning: A comprehensive review on applications in anomaly detection and condition monitoring
Abstract
Authors
Wu Y; Sicard B; Gadsden SA
Journal
Expert Systems with Applications, Vol. 255, ,
Publisher
Elsevier
Publication Date
December 1, 2024
DOI
10.1016/j.eswa.2024.124678
ISSN
0957-4174