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Correcting Charge-Constrained Errors in the...
Journal article

Correcting Charge-Constrained Errors in the Rank-Modulation Scheme

Abstract

We investigate error-correcting codes for a the rank-modulation scheme with an application to flash memory devices. In this scheme, a set of $n$ cells stores information in the permutation induced by the different charge levels of the individual cells. The resulting scheme eliminates the need for discrete cell levels, overcomes overshoot errors when programming cells (a serious problem that reduces the writing speed), and mitigates the problem …

Authors

Jiang AA; Schwartz M; Bruck J

Journal

IEEE Transactions on Information Theory, Vol. 56, No. 5, pp. 2112–2120

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

May 1, 2010

DOI

10.1109/tit.2010.2043764

ISSN

0018-9448