Journal article
Wearout estimation using the Robustness Validation methodology for components in 150°C ambient automotive applications
Abstract
AEC-Q100 is the usual qualification reference for automotive ICs dedicated to applications up to 125°C ambient temperature. Although qualification criteria have been defined which enable the qualification extension up to 150°C, this might always not satisfy the requirements of automotive Zero Defect policy. The mission profile might for instance exceed the scope of AEC-Q100 verifications, or it might be impossible to predict when the wearout …
Authors
Lecuyer P; Fremont H; Landesman J-P; Bahi M-A
Journal
Microelectronics Reliability, Vol. 50, No. 9-11, pp. 1744–1749
Publisher
Elsevier
Publication Date
September 2010
DOI
10.1016/j.microrel.2010.07.076
ISSN
0026-2714